Search for "frequency-modulated atomic force microscopy (FM-AFM)" in Full Text gives 3 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63
Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38
Beilstein J. Nanotechnol. 2014, 5, 2048–2057, doi:10.3762/bjnano.5.213